Kelvin probe force microscopy (KPFM)

The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and liquid environments was required to enable in-situ studies under variable atmospheric conditions. The system provides stable scanning, possibly flexible imaging modes of tapping and/or non-contacting, and compatibility with applications across metals and energy materials. Because of this, the system allows large samples with complex topography. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents. The object of the tender process was described in more detail in the invitation to tender documents.